References

[1] J. A. Abraham and H.C. Shih. Transistor-level test generation for physical failures in CMOS circuits. Design Automation Conference, pages 243–249, 1986.

[2] M. Abramovici, M.A. Breuer, and A.D. Friedman. Digital Systems Testing and Testable Design. Wiley-IEEE Press, 1994.