References

• J. P. Roth, “Diagnosis of Automata Failures: A Calculus and a Method,” IBM Journal of Research and Development, vol. 10, no. 4, pp. 278–291, July 1966. 
• P. Goel, “An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits,” IEEE Trans. on Computers, vol. C-30, no. 3, pp. 215–222, Mar. 1981.
• H. Fujiwara, “FAN: A Fanout-Oriented Test Pattern Generation Algorithm,” in Proc. of the International Symp. on Circuits and Systems, July 1985, pp. 671–674.