References

W. Claeys, S. Dilhaire, and V. Quintard,   "Laser probing of thermal behavior of electronic components and its application in quality and reliability testing",  Microelectronic Engineering,  vol. 24,  pp. 441 - 420, 1994.  :Elsevier 

J. P. Roth, W. G. Bouricius, and P. R. Schneider, “Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic Circuits,” IEEE Trans. on Electronic Computers, vol. EC-16, no. 5, pp. 567–580, Oct. 1967.