Module 11 :Built in Self test (BIST)

Lecture 3 and 4:Memory Testing


Figure 15 LFSR to generate up address sequence for memory BIST

The output sequence generated by the LFSR of Figure 15 is given below.


It may be noted that the LFSR generates all patterns in the range along with the 000 pattern. The seed of the LFSR is 001. The pattern sequence in decimal is 1-0-4-6-7-3-5-2.

As already discussed, for March test the LFSR (Figure 15) should also have a counterpart that can generates a reverse pattern i.e., the reverse LFSR should generate reverse of “1-0-4-6-7-3-5-2”, which is 1-2-5-3-7-6-4-0 (seed is assumed to be same for both the LFSR and its reverse counterpart). Broadly speaking, the reverse LFSR should shift the data in the reverse direction. So to achieve this reverse shift of data, the D and Q terminals are to be swapped in the (forward) LFSR and numbering of the flip-flops is to be made in reverse order. The feedback from last flip-flop to the first one will also have the XOR-NOR gate circuitry (as in the case of forward LFSR) to generate the all-0 sequence. Figure 16 shows the reverse LFSR (for the forward one shown in Figure 15).


Figure 16. Reverse LFSR of the (forward) LFSR in Figure 15

The output sequence generated by the LFSR of Figure 16 is given below.

A broad architecture for memory BIST using LFSR is shown in Figure 17. The various blocks are explained as follows