Atomic Force Microscope:

In the last few lectures, we have covered the electron based microscopes for analyzing the microstructure of the samples.

In the next lectures, we shall focus on other microscopic techniques based on the atomic level forces involved between the sample surface and probing tip.

First we will discuss the atomic force microscope and then scanning probe microscopic technique.

AFM : Schematic View

Figure 19.01: Photoview of the AFM set up [1].

Figure 19.01 shows the typical AFM instrument used for the surface morphology analysis.

Ref.[1]. http://www.nyu.edu/fas/dept/chemistry/wardgroup/CurrentGroupMembers_files/AFM2.jpg