Bright-field imaging mode:

This method is quite useful to study the microstructure of the samples in plane-view and number of multilayers from cross sectional view. The plane view images help in understanding the formation of interior microstructure and determining the average size of the particles.

Figure 14.02: (a) TEM image of FePt-C system prepared by sputtering technique [1], (b) FePt particles prepared by chemical method [2], (c) average size of the grains determined from (a), and (d) cross-section view of the longitudinal hard disk drive.

Ref.[1]. A. Perumal et al, Appl. Phys. Exp. 1 (2008) 101301; http://iopscience.iop.org/1882-0786/1/10/101301/.
Ref.[2]. Sun et al, Science 287 (2000) 1989; http://science.sciencemag.org/content/287/5460/1989.