Transmission Electron Microscope:

Figure 12.03: Photoview of Technai G2 F30 machine and interview column view of the system [1].

Figure 12.03 shows the photographic view of Technai G2 F30 machine and the internal view of the column and e-beam path diagram along with the sample holder. The e-beam generated from the gun is made to pass through the specimen and the transmitted beams are projected on the fluorescent screen with the help of magnetic lenses.

Ref.[1]. http://www.fei.com/products/tem/tecnai-g2/?ind=MS.