• Consider any arbitrary distribution n(x), with x divided into segments (mean free path) wide, with n(x) evaluated at the center of each segment.
  
• In , half of the electrons in segment (1) to the left of would move into segment (2), and in the same time, half of the electrons in segment (2) to the right of would move into segment (1).
  
• Therefore, the net number of electrons moving from segment (1) to segment (2) through within a mean free time , where A is the area perpendicular to x.
  
• Thus, the electron flux density in the +x-direction



• Note: is a small differential length, thus,

where x is taken at the center of segment (1) and x = .

• In the limit of small (i.e., small mean free path between collisions)
  
  
  
  
• The quantity is called the electron diffusion coefficient
• The minus sign in the expression for implies that the diffusion proceeds from higher electron concentration to lower electron concentration.
  
• Similarly, holes diffuse from a region of higher concentration to a region of lower concentration with a diffusion coefficient
  
  Thus,
  
  
  
  and the diffusion current density
  
  

• Note: electrons and holes move together in a carrier gradient, however, the resulting currents are in opposite directions because of the opposite charges of the particles.

Diffusion and Drift of Carriers: Built-in Fields

• The total current density can thus be written as
  
  
  
  
  
  and the total current density is
  
  

• The total current may be due primarily to one of these two components, depending upon the carrier concentrations, their gradients, and the electric field.
  
• Thus, minority carriers can contribute to current conduction significantly through diffusion, even though they contribute very little to the drift term (due to their low concentrations).
  
• Since electrons drift opposite to the direction of the electric field (due to their negative charge), their potential energy increases in the direction of the electric field.
  
• The electrostatic potential varies in the opposite direction, and can be given by V(x) = Ei(x)/(-q).
  
  
• Thus, the electric field can be given by
  
  

• Note: electrons drift downhill in a band diagram, therefore, the electric field points uphill in a band diagram.
  
• Note: in equilibrium, no net current => any fluctuation in carrier concentration which brings about a diffusion current also sets up an electric field, which opposes the diffusive motion => thus, equilibrium is established.
  
• This field is referred to as the built-in field, and can be caused by doping gradients and/or variation in the band gap.
  
• Equating the hole current density equation to zero, we get
  
  

• Now, EF does not vary with x in equilibrium, and the variation of Ei with x is given above, thus,
  
  
  
• This is an extremely important equation valid for both carrier types, and is called the Einstein relation gives the relation between D and , which is a function only of temperature, and allows calculation of one if the other is known.
  

Diffusion and Recombination: The Continuity Equation

• In the description of conduction processes, the effects of recombination must be included, since they can cause a variation in the carrier distribution.
  
• Hole conservation equation:
  
  
  
  i.e., rate of hole buildup = increase of hole concentration in per unit time recombination rate.
  
  
  
  Fig.3.7 Setup to obtain particle count: current entering and leaving a volume .

• For ,
  
  
  
  
• This is called the continuity equation for holes, and, similarly, for electrons, we can write
  
  
  
  
• When the current is carried entirely due to diffusion (negligible drift), then we obtain the diffusion equation for electrons, given by
  
  and, similarly for holes,
  
  
  
  

Steady State Carrier Injection: Diffusion Length

• In steady state, if a distribution of excess carriers is maintained, then the diffusion equations become
  
  
  
  where
  
  are the electron diffusion length and the hole diffusion length, which is the average distance an electron or a hole diffuses before recombining respectively.
  
  
• Case study: suppose excess holes are injected into a semi-infinite n-type bar, which maintains a constant concentration (relevant problem in a forward biased diode).
  
  
• Obviously, the excess holes would diffuse into the n-type bar, recombine with the electrons with a characteristic lifetime (and diffusion length ), and for large values of x, the excess hole concentration should decay to zero; thus,
  
  
  
  and the decay profile is exponential.
  
  
• The steady state distribution of excess holes causes diffusion, and therefore, a hole current in the direction of decreasing concentration, given by
  
  
  
  (This equation would come handy in the diode analysis.)
  
  

The Haynes-Shockley Experiment

• Counterpart of the Hall effect experiment.
  
• Independently determines the minority carrier mobility and diffusion coefficient
  
  .
  
  Fig.3.8 Schematic for Haynes-Shockley experiment: drift and diffusion of a hole pulse in an n-type bar:
  
  (a) sample geometry,
  (b) shape and position of the pulse for different times along the bar.
  
  Basic principle
  
• a pulse of excess holes is created in an n-type bar (which has an applied electric field),
  
• as time progresses, the holes spread out by diffusion and move due to the electric field, and their motion is monitored somewhere down the bar,