• This course mainly focuses on principles and applications of various instruments generally used in characterization of engineering materials.

• This course is covered in seven different modules with each one focusing on particular properties. A total of 40 lectures including the introduction to materials and techniques will be delivered to cover the characterization of materials.

• Module 2 deals with the diffraction based structural analysis. First we start with X-ray characteristics and generation, lattice planes and Bragg's law, powder diffraction, thin film diffraction, phase identification, indexing and lattice parameter determination, analytical line profile fitting using various models. Secondly, the structural characterization using neutron diffraction, low-energy electron diffraction (LEED ) and Reflection high-energy electron diffraction (RHEED) is discussed. These topics will be covered in seven lectures.

• In module 3, the analysis of microstructures using different types of microscopes such as Optical Microscopy (OM), Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), and the composition analysis using Energy Dispersive X-ray analysis (EDAX), Rutherford backscattering spectrometry (RBS), and Atomic force microscopy (AFM) are discussed in detail. Twelve lectures are dedicated to cover various types of microscopy techniques.

• Module 4 covers the thermal property analysis using differential thermal analysis and differential scanning calorimetry and thermo-gravimetric analysis. These details would be covered in three lectures.