Module 5 : Modern Characterization of materials

Lecture 36: X- Ray Photoelectron Spectroscopy (XPS)


Interpreting XPS Spectrum: Background

• The X-Ray will hit the e- s in the bulk (inner e- layers) of the sample

• e- will collide with other e- from top layers, decreasing its energy to contribute to the noise, at lower kinetic energy than the peak .

• The background noise increases with BE because the SUM of all noise is taken from the beginning of the analysis .