Characterization methods
Scanning Probe Microscopy (SPM): |
Raman Spectroscopy |
Transmission electron Microscopy (TEM) |
X-ray diffraction (XRD) |
- Atomic force microscopes (AFMs)
- Scanning tunneling microscopy (STM)
 |
 Atomic force microscopy images of a graphite oxide film deposited by Langmuir-Blodgett assembly |