Course abstract
Testing is an integral part of the VLSI design cycle. With the advancement in IC technology, designs are becoming more and more complex, making their testing challenging. Testing occupies 60-80% time of the design process. A well structured method for testing needs to be followed to ensure high yield and proper detection of faulty chips after manufacturing. Design for testability (DFT) is a matured domain now, and thus needs to be followed by all the VLSI designers. In this context, the course attempts to expose the students and practitioners to the most recent, yet fundamental, VLSI test principles and DFT architectures in an effort to help them design better quality products that can be reliably manufactured in large quantity.
Course Instructor
Prof. Santanu Chattopadhyay
Santanu Chattopadhyay received his PhD from Indian Institute of Technology (IIT) Kharagpur in 1996. He is currently a Professor in the Department of Electronics and Electrical Communication Engineering, IIT Kharagpur. His research interests include Embedded Systems, System-on-Chip (SoC) and Network-on-Chip (NoC) Design and Test, Power- and Thermal-aware Testing of VLSI Circuits and Systems. He has published more than 150 papers in reputed international journals and conferences. He has published several text and reference books in the related areas. He is a senior member of IEEE and an editorial board member of IET Circuits Devices and Systems.More info
Teaching Assistant(s)
No teaching assistant data available for this course yetCourse Duration : Sep-Dec 2020
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Enrollment : 20-May-2020 to 21-Sep-2020
Exam registration : 14-Sep-2020 to 02-Nov-2020
Exam Date : 19-Dec-2020
Enrolled
5080
Registered
250
Certificate Eligible
149
Certified Category Count
Gold
1
Silver
7
Elite
41
Successfully completed
100
Participation
67
Success
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Category : Successfully Completed
Elite
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Category : Elite
Silver
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Category : Silver
Gold
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Category : Gold
Legend
AVERAGE ASSIGNMENT SCORE >=10/25 AND EXAM SCORE >= 30/75 AND FINAL SCORE >=40BASED ON THE FINAL SCORE, Certificate criteria will be as below:
>=90 - Elite + Gold
75-89 -Elite + Silver
>=60 - Elite
40-59 - Successfully Completed
Final Score Calculation Logic
- Assignment Score = Average of best 8 out of 12 assignments.
- Final Score(Score on Certificate)= 75% of Exam Score + 25% of Assignment Score
Enrollment Statistics
Total Enrollment: 5080
Registration Statistics
Total Registration : 250
Assignment Statistics
Feedback Videos
Exam score
Final score