P-N junction Diodes
Abrupt p-n junction
Fig.10.3
Built-in potential= 
At equilibrium 
Thus
Thus minority carrier in n side
minority carrier in p side
Thermal equilibrium E field in neutral regions=0
Thus Total-ve charge in P side-total + ve charge in n side
Fig.11.4
Poissons Equation 
In n side 
.
Integrating
for 
|
for 
|
Maxwell's field at x=0(junction) 
Also we obtain 
W=Total depletion region width
Eliminating from previous 3 equations.
More accurate expression for depletion region width
 
If one side is heavily doped the depletion region is in weakly doped place) Depletion -layer capacitance per unit area
, Incremental increase in charge per unit area for a voltage increase of
Inside depletion layer assuming the following
. Boltzman relation is an approximation
. Abrupt Depletion Layer
. Low injection (injected minority carrier < majority carrier)
. No generation current inside depletion layer
where and 
When voltage is applied the minority carrier densities on both sides are changed and 
are imrefs or quasi Fermi level for electrons and holes (E Fn and E Fp ) under nonequilibrium condition as applied voltage/bias or optical field as shown in Fig. 10.4
....... 
|
Forward bias  
Reversed bias  
Now = 
Similarly
Electron and hole current densities is proportional to gradient of quasi Fermi level.
Now applied voltage across the junction. Now at the boundary of depletion layer at p side i.e. at
We have from (A) & (B)
Where is the equilibrium electron density on the p side.
Similarly  |
Where is the equilibrium hole density on the p side.
n side Continuity equation in steady state
Let recombination rate
Then in 1-D we obtain
(steady state)
|
for n side 
Charge neutrality holds approximately

ultiplying first by and second equation by and taking Einstein relation as 
we get  |
=lifetime
|
as in n-type |
Low injection assumption  |
Neutral region 
Now Boundary condition (injection)
assuming large structure
exponential decay of electron and hole current components in the Depletion region as shown in Fig. 10.5
|