Chapter 3   : Fabrication of CMOS Integrated Circuits
N = concentration (cm-3)
N0 = surface concentration (cm-3)
x = position inside silicon relative to the surface
D = diffusion coefficient for dopant (cm2/s)
t = time (seconds)
and
N0 = surface concentration after the drive (cm-3)
N01 = surface concentration after the drive (cm-3)
D1 = diffusion coefficient f of dopant during the predep (cm2/s)
t1 = time of the predep (seconds)
D2 = diffusion coefficient f of dopant during the drive (cm2/s)
t2 = time of the drive (seconds)