Module 5 : Modern Characterization of materials

Lecture 35: Transmission electron microscopy

Transmission Electron Microscopy

TEM – Transmission Electron Microscopy

 

Typical Acceleration voltage is 100 – 400kV (some instruments use 1-3 MV)

Spread broad probe across specimen – form image from transmitted electrons

Diffraction data can be obtained from image area

Main limitation on resolution – aberrations in main imaging lens