| 1 | Lecture 01: Introduction to Microscopy | PDF unavailable |
| 2 | Lecture 02: Scanning Electron Microscopy | PDF unavailable |
| 3 | Lecture 03: SEM and Its Capabilities | PDF unavailable |
| 4 | Lecture 04: Main Components of SEM - Electron Guns | PDF unavailable |
| 5 | Lecture 05: Main Components of SEM - Electron Guns and Electromagnetic Lenses | PDF unavailable |
| 6 | Lecture 06: Electron Probe Diameter Verses Electron Probe Current | PDF unavailable |
| 7 | Lecture 07: Electron Beam - Specimen Interaction | PDF unavailable |
| 8 | Lecture 08: Detectors | PDF unavailable |
| 9 | Lecture 09: BSE Detector and Sample Preparation for SEM | PDF unavailable |
| 10 | Lecture 10: Parameters Need to be Considered to obtain a Good SEM Image | PDF unavailable |
| 11 | Lecture 11: How to Get a Good SEM Image | PDF unavailable |
| 12 | Lecture 12: Additional Capabilities of SEM | PDF unavailable |
| 13 | Lecture 13: Additional Capabilities of SEM (Contd.) | PDF unavailable |
| 14 | Lecture 14: Additional Capabilities of SEM (Contd.) | PDF unavailable |
| 15 | Lecture 15: Scanning Ion Microscopy - An Introduction | PDF unavailable |
| 16 | Lecture 16: Ions Versus Electrons as Source for Microscopy | PDF unavailable |
| 17 | Lecture 17: Ions Source in HIM | PDF unavailable |
| 18 | Lecture 18: GFIS Properties and Ion Optical Column | PDF unavailable |
| 19 | Lecture 19: Ion Optical Column | PDF unavailable |
| 20 | Lecture 20: Ion-Solid Interactions and Signal Generation | PDF unavailable |
| 21 | Lecture 21: Signal Generation and Contrast Mechanism | PDF unavailable |
| 22 | Lecture 22: Contrast Mechanism and Imaging Modes | PDF unavailable |
| 23 | Lecture 23: Scanning Transmission Ion Microscopy and Microanalysis with HIM | PDF unavailable |
| 24 | Lecture 24: Creation and Modification of Materials by HIM | PDF unavailable |
| 25 | Lecture 25: Scanning probe microscopy, properties of SPM | PDF unavailable |
| 26 | Lecture 26: STM- Instrumentation | PDF unavailable |
| 27 | Lecture 27: Main Components of STM | PDF unavailable |
| 28 | Lecture 28: Main Components of STM (Contd.) | PDF unavailable |
| 29 | Lecture 29: Main Components of STM (Contd.) | PDF unavailable |
| 30 | Lecture 30: Working Principle of STM | PDF unavailable |
| 31 | Lecture 31: Operating Modes | PDF unavailable |
| 32 | Lecture 32: Scanning Tunneling Spectroscopy | PDF unavailable |
| 33 | Lecture 33: SPM - Atomic Force Microscopy (AFM) | PDF unavailable |
| 34 | Lecture 34:Force Between Tip and Sample in AFM | PDF unavailable |
| 35 | Lecture 35: Atomic Force Microscope - Parts | PDF unavailable |
| 36 | Lecture 36: Modes of AFM Operation | PDF unavailable |
| 37 | Lecture 37: Dynamic mode AFM, Tapping mode | PDF unavailable |
| 38 | Lecture 38: AFM Imaging | PDF unavailable |
| 39 | Lecture 39: Phase Imaging, Noises and Resolution | PDF unavailable |
| 40 | Lecture 40: Surface Properties Measurements using Other Forces | PDF unavailable |
| 41 | Lecture 41: Surface Properties Measurements using AFM | PDF unavailable |
| 42 | Lecture 42: Manipulation of Atoms, Molecules and Industrial Applications | PDF unavailable |
| 43 | Lecture 43: Summary | PDF unavailable |