| Introduction | Self Assessment 1 | Self Assessment 1 | 653 |
| Scheduling, Allocation and Binding | Self Assessment 2 | Self Assessment 2 | 10 |
| Logic Optimization and Synthesis | Self Assessment 3 | Self Assessment 3 | 66 |
| Binary Decision Diagram | Self Assessment 4 | Self Assessment 4 | 353 |
| Temporal Logic | Self Assessment 5 | Self Assessment 5 | 195 |
| Model Checking | Self Assessment 6 | Self Assessment 6 | 210 |
| Introduction to Digital Testing | Self Assessment 7 | Self Assessment 7 | 64 |
| Fault Simulation and Testability Measures | Self Assessment 8 | Self Assessment 8 | 56 |
| Combinational Circuit Test Pattern Generation | Self Assessment 9 | Self Assessment 9 | 61 |
| Sequential Circuit Testing and Scan Chains | Self Assessment 10 | Self Assessment 10 | 66 |
| Built in Self test (BIST) | Self Assessment 11 | Self Assessment 11 | 10 |