Radiative and nonradiative recombination process
 
 
 
4.3 Radiative and nonradiative recombination process
Till now we considered various cases of electron hole pair generation, which is how an electron transports in band-band or intraband transitions. Now let us see how the generated electron recaptures with a hole. As mentioned in the introduction, the recombination of electron could be classified into three major categories:
(1) band to band recombination, emitting a photon (radiative),
(2) recombination by means of simply giving away energy to phonons and
(3) recombination by transferring kinetic energy to another electron and knocking out into higher energy levels.

 
 
 
4.3.1 Radiative recombination
 
This Band-to-band recombination happens when an electron moves from its conduction band state to the empty valence band state associated with the hole. The radiative recombination is a very important feature in semiconductor optoelectronics. The generation and recombination rates are interrelated as both processes follow the same path . The recombination rate is given by



Eq9 is born out of our previous discussion where the electron generation and



Fig3.10 Radiative life times and efficiency of p-doped GaAs vs Carrier concentration

 
recombination occurred between two initial and final momentum vectors Ki and Kf. ( see Eq.1-3). Let us recap again, the absorption states are , and emission states , However, the situation is not simple in semiconductors. Here we have several exceptions (for example, the presence of forbidden gap impurity levels and lattice related defect centers) those disobey the above general rule. In general, the absorption is followed by both radiative and nonradiative recombinations. The radiative recombination could be both spontaneous ( initial and final photon are incoherent) and stimulated (both photons are in phase).

The spontaneous radiate recombination rate, without any further discussion, given as



integration over is needed to count the photons in 3D to get the rates for all the occupied and hole states. here , Fermi functions of electrons holes and respective representations of f(E) and reduced density of states Ncv are given in Eq.2.

Here the Eq10, takes different conductions depending of carrier injection (optical, electrical or thermal).

(i) Minority carrier injection:
If the electron density is greater than hole density, then fe(Ee) is almost unity and the radiative rate is This means the radiative rates are proportional to the minority carrier densities.

(ii) Strong injection:
In this case very high densities of both electrons and holes are injected. In that case, both Fermi functions could be treated as very sharp functions and hence the radiative rate is

(iii) Weak injection:
Here we can write the Fermi functions in terms of Boltzmann distribution. Then rates turns out as where If we turn the total charge (n or p) as n+ Δn (similarly for p) then we will have the radiative rates for excess carrier concentration as This condition suggests that for low injection, the radiative life times (1/Rsp) are much smaller than . Means electrons have much less probability to find a hole to recombine.

(iv) Inversion :
If the sum of both densities is equal to one , then the radiative rate is equal to or . This is typically the threshold condition for a semiconductor diode laser.

Gain:
Though it is not totally relevant here, for the sake of continuity, we have to see how these radiative transitions turn into mega-light amplifiers, ie., lasers. Prerequisite for a laser material is to have optical gain. In normal conditions, an electron travels from valence band to conduction band by absorbing a photon. If we assume a condition where the valence band if fully empty and conduction band is rich of electrons? . This happens only when we continuously pump electrons (population inversion). At this situation more number of photons are emitted than absorbed. This nonlinear phenomenon is called stimulated emission and the coefficient is called optical gain. This is simply the difference between the emission coefficient and the absorption coefficient. If the value is positive, then the material is gaining otherwise, loss. The gain and loss vary with the input power of injection of carriers. If we assume as 1-D system, the gain (g) and loss ( α) are related to emission as . Keep in mind that the gain spectrum is at higher energy side to the emission spectrum.

Table 4.3.1
Table 1 Gain cross section per quantum dot/ nanocrystal determined for various material systems
Quantum dot material Net modal gain (cm-1) Net Material gain (x 104cm-1) Areal dot density (Cm-2) Active layer thickness(nm) Filling factor (x10-4) Gain cross section per dot(x10-16cm-2) Reference
InAs Single QD layer 8.2 9* 1x1011 1.7 1.2 1200 16
InAs 7 QD Stacks 70-85 1.5* 1x1011 100 48 4000 17
GaAs Single QD layer 13*   1x1010     450* 18
Si NS 100 1 2x1014 100 970 0.5-5 This Work
Calculated Approximately

** http://prakash.iitd.ac.in/pub.htm


Here we have considered that only the conduction and valence bands are responsible for radiative transitions. However, in some exceptional cases, it is also possible to turn the intermediate levels (such as impurity levels or defect levels) as radiative centers. This one can be visualized as the energy transfer between two radiative systems, where the end -emitter is at minority level (for example see the literature for Silicon nanocrystals and Erbium).



 
4.3.2. Non-radiative recombination (Shockley-Read-Hall process)
 
 


Fig3.11 nonradiative recombination processes (a) recombination center, (2) electron and (3) hole trap.
 
 
As mentioned before, in this process the electron recombines with hole without any emission, simply giving away its energy. This non-radiative process competes with the radiative recombination. This usually takes via surface states or bulk defects and traps, those we are going to discuss now. Generalising the total life times (1/Rtotal)



These nonradiative recombinations are having both positive and negative importance. For instance, for light emitting applications (such as lasers) nonradiative deactivation is undesirable, whereas for p-n diodes these are highly essential to increase the speed of device (switching times).

Let us consider a trap level (Et) with density of Nt. As you can see, both the electrons and holes have capture and hole centers at Et.

If vth is the thermal velocity (one can derive velocity from 1/2mv2=KBT), n is the electron concentration and σ is the electron/hole cross-sections ( typically 10-13 to 1015cm2), then the capture rate is given as



The captured electron from Eq15 will give away energy to phonon with an emission (or capture ) rate of


Where Pn is the electron emission rate

Similarly the above two equations for holes also exist as

and

at equilibrium Eq15 and 16 are equal similarly Eq17=Eq18.
 
  Fig.3.12 SRH life times for different carrier injection with three different dopant levels, in crystalline Si with Fe as dopant
We know how to derive the electron density (n) and Fermi distribution (f(Et)) from lecture notes(2) Eq.16 and 20


one can derive using above expressions the reemitted rate Pn as



We are interested in the rate of change of carrier concentration (electrons and holes), which is given as


With little effort one can write Rt in terms of above quantities and defining terms



Above expression is called Shockley-read-hall* equation for recombination rate via deep levels in the band gap. One can simplify the above expression by assuming


and Et = Efi



For low –level injection of n-type semiconductor ( n>>p) One would also write above Eq23. as , where p and p0 are respectively the non-equilibrium and equilibrium hole electron concentrations (similarly for holes). Hence the decay rates are not from the majority carriers (here electrons), but from minority carriers.

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♣ read more at Phys. Rev. B, 67 075203 (2003), and animated simulation software of SRH available at http://www.imt.fb12.uni-siegen.de/he/aktuelles/srh-e.htm
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4.3.3 Auger Non-radiative processes
 


Fig.3.13 Auger recombination representation: (a) 2e-1h and (b) 1e-2h recombination
 
 
As we discussed in the previous section, in the impact ionisation: one hot electron with energy greater than bang gap scatters another electron into higher states in the valence band to produce two electron and one hole (similarly for hole). The Auger processes are exactly opposite to this. The schematic representation of possible electron hole recombination of this kind is given in the fig.3.13. There are two processes mainly in this recombination:

 
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♣ I pronounce it as “ AUW_gher”. There is a hard debate on the pronunciation of “Auger”, As it is a French name and is pronounced in France as “ OZ-Zhey”. But many in English speaking people ( though I cant generalize here) pronounce it more like “ AUW-gher”. Some say it is must be the second pronunciation as it the person’s family rout is from German –French side. Some also debate it is originated from Anglo-Norman ancestors of Europe, started as alger… alcher… auger.. ( from Dictionary of British Names 2nd Edition by P. H. Reaney with corrections by R. M. Wilson © 1976 page 5)

This effect was discovered independently by both Lise Meitner and Pierre Auger in the 1920's. Though the discovery was made and reported by Meitner in 1923 in the journal Zeitschrift für Physik, two years before Auger discovered the effect, the English speaking scientific community came to attach Auger's name to it, perhaps because of the political climate of Europe at the time is marinated with sexism ( comments are not mine!!! comment from www.chemistrydaily.com).
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(1) one electron from conduction band recombines with hole in valence band (heavy-hole state) by giving away energy to another electron in conduction band. The energy gained electron jumps to a higher state and subsequently relaxes to valence band by giving energy as phonon . This is called conduction-conduction- heavy hole conduction (CCHC) (just after the individual carriers in their respective states)

(2) one electron from conduction band recombines with hole in the valence band (heavy hole state) and knocks one hole deep into the split-off level. This is conduction heavy hole-heavy hole-split off (CHHS) process.

Keep in mind both the processes are non-radiative. The expression for the net Auger recombination rate is similar to the band-to-band recombination but includes the density of the electrons or holes, which receive the released energy from the electron-hole recombination.



Above expression involves both the processes. The non-radiative lifetimes can simply be written as . At very high dopant levels, radiative and auger processes are more dominant. More generalised life time representation is



Auger theory is highly dependent on many variants: approximations, band structure calculations and wave functions.

The over all lifetime of recombination is



More or less the auger processes are not of much importance in wide band gap materials, as the auger processes here is phonon assisted.