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Metallurgy and Material Science
NOC:Scanning Electron / Ion / Probe Microscopy in Materials Characterization (Video)
Syllabus
Co-ordinated by :
IIT Kharagpur
Available from :
2020-11-18
Lec :
1
Modules / Lectures
Intro Video
Module 01:
Lecture 01: Introduction to Microscopy
Lecture 02: Scanning Electron Microscopy
Lecture 03: SEM and Its Capabilities
Lecture 04: Main Components of SEM - Electron Guns
Lecture 05: Main Components of SEM - Electron Guns and Electromagnetic Lenses
Module 02:
Lecture 06: Electron Probe Diameter Verses Electron Probe Current
Lecture 07: Electron Beam - Specimen Interaction
Lecture 08: Detectors
Lecture 09: BSE Detector and Sample Preparation for SEM
Lecture 10: Parameters Need to be Considered to obtain a Good SEM Image
Module 03:
Lecture 11: How to Get a Good SEM Image
Lecture 12: Additional Capabilities of SEM
Lecture 13: Additional Capabilities of SEM (Contd.)
Lecture 14: Additional Capabilities of SEM (Contd.)
Lecture 15: Scanning Ion Microscopy - An Introduction
Module 04:
Lecture 16: Ions Versus Electrons as Source for Microscopy
Lecture 17: Ions Source in HIM
Lecture 18: GFIS Properties and Ion Optical Column
Lecture 19: Ion Optical Column
Lecture 20: Ion-Solid Interactions and Signal Generation
Module 05:
Lecture 21: Signal Generation and Contrast Mechanism
Lecture 22: Contrast Mechanism and Imaging Modes
Lecture 23: Scanning Transmission Ion Microscopy and Microanalysis with HIM
Lecture 24: Creation and Modification of Materials by HIM
Lecture 25: Scanning probe microscopy, properties of SPM
Module 06:
Lecture 26: STM- Instrumentation
Lecture 27: Main Components of STM
Lecture 28: Main Components of STM (Contd.)
Lecture 29: Main Components of STM (Contd.)
Lecture 30: Working Principle of STM
Module 07
Lecture 31: Operating Modes
Lecture 32: Scanning Tunneling Spectroscopy
Lecture 33: SPM - Atomic Force Microscopy (AFM)
Lecture 34:Force Between Tip and Sample in AFM
Lecture 35: Atomic Force Microscope - Parts
Module 08:
Lecture 36: Modes of AFM Operation
Lecture 37: Dynamic mode AFM, Tapping mode
Lecture 38: AFM Imaging
Lecture 39: Phase Imaging, Noises and Resolution
Lecture 40: Surface Properties Measurements using Other Forces
Lecture 41: Surface Properties Measurements using AFM
Lecture 42: Manipulation of Atoms, Molecules and Industrial Applications
Lecture 43: Summary
Live Session
Live Session 25-03-2021
Live Session 13-04-2021
Watch on YouTube
Assignments
Transcripts
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Sl.No
Chapter Name
English
1
Lecture 01: Introduction to Microscopy
PDF unavailable
2
Lecture 02: Scanning Electron Microscopy
PDF unavailable
3
Lecture 03: SEM and Its Capabilities
PDF unavailable
4
Lecture 04: Main Components of SEM - Electron Guns
PDF unavailable
5
Lecture 05: Main Components of SEM - Electron Guns and Electromagnetic Lenses
PDF unavailable
6
Lecture 06: Electron Probe Diameter Verses Electron Probe Current
PDF unavailable
7
Lecture 07: Electron Beam - Specimen Interaction
PDF unavailable
8
Lecture 08: Detectors
PDF unavailable
9
Lecture 09: BSE Detector and Sample Preparation for SEM
PDF unavailable
10
Lecture 10: Parameters Need to be Considered to obtain a Good SEM Image
PDF unavailable
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